On line conformity analysis on perforated plastic films by automated visual inspection

Luc Duvieubourg, J. Caron, Jack-Gérard Postaire. On line conformity analysis on perforated plastic films by automated visual inspection. In Robert J. Howlett, Lakhmi C. Jain, editors, Fourth International Conference on Knowledge-Based Intelligent Information Engineering Systems & Allied Technologies, KES 2000, Brighton, UK, 30 August - 1 September 2000, Proceedings, 2 Volumes. pages 377-380, IEEE, 2000. [doi]

Authors

Luc Duvieubourg

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J. Caron

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Jack-Gérard Postaire

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