Luc Duvieubourg, J. Caron, Jack-Gérard Postaire. On line conformity analysis on perforated plastic films by automated visual inspection. In Robert J. Howlett, Lakhmi C. Jain, editors, Fourth International Conference on Knowledge-Based Intelligent Information Engineering Systems & Allied Technologies, KES 2000, Brighton, UK, 30 August - 1 September 2000, Proceedings, 2 Volumes. pages 377-380, IEEE, 2000. [doi]
@inproceedings{DuvieubourgCP00,
title = {On line conformity analysis on perforated plastic films by automated visual inspection},
author = {Luc Duvieubourg and J. Caron and Jack-Gérard Postaire},
year = {2000},
doi = {10.1109/KES.2000.885835},
url = {http://dx.doi.org/10.1109/KES.2000.885835},
tags = {analysis},
researchr = {https://researchr.org/publication/DuvieubourgCP00},
cites = {0},
citedby = {0},
pages = {377-380},
booktitle = {Fourth International Conference on Knowledge-Based Intelligent Information Engineering Systems & Allied Technologies, KES 2000, Brighton, UK, 30 August - 1 September 2000, Proceedings, 2 Volumes},
editor = {Robert J. Howlett and Lakhmi C. Jain},
publisher = {IEEE},
isbn = {0-7803-6400-7},
}