Henry Duwe, Xun Jian, Daniel Petrisko, Rakesh Kumar 0002. Rescuing Uncorrectable Fault Patterns in On-Chip Memories through Error Pattern Transformation. In 43rd ACM/IEEE Annual International Symposium on Computer Architecture, ISCA 2016, Seoul, South Korea, June 18-22, 2016. pages 634-644, IEEE, 2016. [doi]
@inproceedings{DuweJP016,
title = {Rescuing Uncorrectable Fault Patterns in On-Chip Memories through Error Pattern Transformation},
author = {Henry Duwe and Xun Jian and Daniel Petrisko and Rakesh Kumar 0002},
year = {2016},
doi = {10.1109/ISCA.2016.61},
url = {http://doi.ieeecomputersociety.org/10.1109/ISCA.2016.61},
researchr = {https://researchr.org/publication/DuweJP016},
cites = {0},
citedby = {0},
pages = {634-644},
booktitle = {43rd ACM/IEEE Annual International Symposium on Computer Architecture, ISCA 2016, Seoul, South Korea, June 18-22, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8947-1},
}