Truong Vinh Truong Duy, Naotake Natori. Efficient Defect Detection from Consecutive Monocular Images by Deep Learning. In M. Arif Wani, Feng Luo 0001, Xiaolin Andy Li, Dejing Dou, Francesco Bonchi, editors, 19th IEEE International Conference on Machine Learning and Applications, ICMLA 2020, Miami, FL, USA, December 14-17, 2020. pages 473-478, IEEE, 2020. [doi]
Abstract is missing.