Anurag Dwarakanath, Manish Ahuja, Samarth Sikand, Raghotham M. Rao, R. P. Jagadeesh Chandra Bose, Neville Dubash, Sanjay Podder. Identifying implementation bugs in machine learning based image classifiers using metamorphic testing. In Frank Tip, Eric Bodden, editors, Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2018, Amsterdam, The Netherlands, July 16-21, 2018. pages 118-128, ACM, 2018. [doi]
Abstract is missing.