Jennifer Dworak. An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 205-210, IEEE Computer Society, 2007. [doi]
@inproceedings{Dworak07,
title = {An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting},
author = {Jennifer Dworak},
year = {2007},
doi = {10.1109/VTS.2007.14},
url = {http://dx.doi.org/10.1109/VTS.2007.14},
tags = {analysis, context-aware},
researchr = {https://researchr.org/publication/Dworak07},
cites = {0},
citedby = {0},
pages = {205-210},
booktitle = {25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA},
publisher = {IEEE Computer Society},
}