On critical relative distance of DNA codes for additive stem similarity

Arkadii G. D'yachkov, A. Voronina, Anthony J. Macula, Thomas E. Renz, Vyacheslav V. Rykov. On critical relative distance of DNA codes for additive stem similarity. In IEEE International Symposium on Information Theory, ISIT 2010, June 13-18, 2010, Austin, Texas, USA, Proceedings. pages 1325-1329, IEEE, 2010. [doi]

Abstract

Abstract is missing.