A global entropy criterion for focus tuning in exit wavefunction reconstruction in high resolution electron microscopy - researchr publication

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Dirk Van Dyck, Marc Op de Beeck, D. Tang, J. Jansen, H. W. Zandbergen. A global entropy criterion for focus tuning in exit wavefunction reconstruction in high resolution electron microscopy. In ICIP (1). pages 737-740, 1996. [doi]

Abstract is missing.

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