Peter Dziel. The Need for Complete System Level Test Standardization. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 941, IEEE Computer Society, 1996.
@inproceedings{Dziel96, title = {The Need for Complete System Level Test Standardization}, author = {Peter Dziel}, year = {1996}, tags = {completeness, testing}, researchr = {https://researchr.org/publication/Dziel96}, cites = {0}, citedby = {0}, pages = {941}, booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996}, publisher = {IEEE Computer Society}, isbn = {0-7803-3541-4}, }