A 28nm CMOS ultra-compact thermal sensor in current-mode technique

Matthias Eberlein, Idan Yahav. A 28nm CMOS ultra-compact thermal sensor in current-mode technique. In 2016 IEEE Symposium on VLSI Circuits, VLSIC 2016, Honolulu, HI, USA, June 15-17, 2016. pages 1-2, IEEE, 2016. [doi]

Authors

Matthias Eberlein

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Idan Yahav

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