Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Behzad Ebrahimi, Ali Afzali-Kusha, Hamid Mahmoodi. Robust FinFET SRAM design based on dynamic back-gate voltage adjustment. Microelectronics Reliability, 54(11):2604-2612, 2014. [doi]