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Testing for Intermittent Resistive Faults in CMOS Integrated Systems

Hassan Ebrahimi, Hans G. Kerkhoff. Testing for Intermittent Resistive Faults in CMOS Integrated Systems. In Paris Kitsos, editor, 2016 Euromicro Conference on Digital System Design, DSD 2016, Limassol, Cyprus, August 31 - September 2, 2016. pages 703-707, IEEE Computer Society, 2016. [doi]

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Hassan Ebrahimi

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Hans G. Kerkhoff

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