Hassan Ebrahimi, Hans G. Kerkhoff. Testing for Intermittent Resistive Faults in CMOS Integrated Systems. In Paris Kitsos, editor, 2016 Euromicro Conference on Digital System Design, DSD 2016, Limassol, Cyprus, August 31 - September 2, 2016. pages 703-707, IEEE Computer Society, 2016. [doi]
@inproceedings{EbrahimiK16,
title = {Testing for Intermittent Resistive Faults in CMOS Integrated Systems},
author = {Hassan Ebrahimi and Hans G. Kerkhoff},
year = {2016},
doi = {10.1109/DSD.2016.58},
url = {http://doi.ieeecomputersociety.org/10.1109/DSD.2016.58},
researchr = {https://researchr.org/publication/EbrahimiK16},
cites = {0},
citedby = {0},
pages = {703-707},
booktitle = {2016 Euromicro Conference on Digital System Design, DSD 2016, Limassol, Cyprus, August 31 - September 2, 2016},
editor = {Paris Kitsos},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-2817-7},
}