Ran Edeleman, Ishai Kreiser. Correlation of Capacitive Load Delay. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 247-252, IEEE Computer Society, 1992.
@inproceedings{EdelemanK92, title = {Correlation of Capacitive Load Delay}, author = {Ran Edeleman and Ishai Kreiser}, year = {1992}, researchr = {https://researchr.org/publication/EdelemanK92}, cites = {0}, citedby = {0}, pages = {247-252}, booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992}, publisher = {IEEE Computer Society}, isbn = {0-7803-0760-7}, }