Robert Edmondson, Gregory Iovino, Richard Kacprowicz. Optimizing the Cost of Test at Intel Using per Device Data. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-8, IEEE, 2006. [doi]
No references recorded for this publication.
No citations of this publication recorded.