Dmitry V. Efanov, Valery V. Sapozhnikov, Vladimir V. Sapozhnikov, German Osadchy, Teng Teng. Sum Codes of Weighted Data Bits for Objectives of Automation Logical Devices Technical Diagnostics. In 2019 IEEE East-West Design & Test Symposium, EWDTS 2019, Batumi, Georgia, September 13-16, 2019. pages 1-10, IEEE, 2019. [doi]
Abstract is missing.