Nikolaos Eftaxiopoulos-Sarris, Nicholas Axelos, Georgios Zervakis, Kostas Tsoumanis, Kiamal Z. Pekmestzi. An independent dual gate SOI FinFET soft-error resilient memory cell. In 9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014. pages 39-44, IEEE, 2014. [doi]
Abstract is missing.