Stephan Eggersglus. Compact test set generation for test compression-based designs. In 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{Eggersglus15,
title = {Compact test set generation for test compression-based designs},
author = {Stephan Eggersglus},
year = {2015},
doi = {10.1109/ETS.2015.7138769},
url = {http://dx.doi.org/10.1109/ETS.2015.7138769},
researchr = {https://researchr.org/publication/Eggersglus15},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7603-4},
}