Stephan Eggersglüß. Dynamic X-filling for Peak Capture Power Reduction for Compact Test Sets. J. Electronic Testing, 30(5):557-567, 2014. [doi]
@article{Eggersgluss14,
title = {Dynamic X-filling for Peak Capture Power Reduction for Compact Test Sets},
author = {Stephan Eggersglüß},
year = {2014},
doi = {10.1007/s10836-014-5472-6},
url = {http://dx.doi.org/10.1007/s10836-014-5472-6},
researchr = {https://researchr.org/publication/Eggersgluss14},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {30},
number = {5},
pages = {557-567},
}