Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits

Behzad Eghbalkhah, Mehdi Kamal, Hassan Afzali-Kusha, Ali Afzali-Kusha, M. B. Ghaznavi-Ghoushchi, Massoud Pedram. Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits. Microelectronics Reliability, 55(8):1152-1162, 2015. [doi]

Abstract

Abstract is missing.