Hans Ehm, Frederic Jankowiak, Veronika Filser, Tim Lauer, Anh Nguyen. A Generic VMI Measurement and Application in the semiconductor Industry. In 2018 Winter Simulation Conference, WSC 2018, Gothenburg, Sweden, December 9-12, 2018. pages 3449-3460, IEEE, 2018. [doi]
Abstract is missing.