Saeedreza Ehteram, Alborz Rezazadeh Sereshkeh, Seyed Zeinolabedin Moussavi, Ali Sadr, Ali Akbar Jalali. Utilizing a Pattern Recognition Controller and Linear Discriminate Analysis for MFL Defect Detection. JCIT, 4(1):11-19, 2009. [doi]
Abstract is missing.