Ahmed H. Eid, Brian E. Cooper. On the analysis of wavelet-based approaches for print mottle artifacts. In Sophie Triantaphillidou, Mohamed-Chaker Larabi, editors, Image Quality and System Performance XI, San Francisco, California, USA, February 2-6, 2014. Volume 9016 of SPIE Proceedings, pages 901609, SPIE, 2014. [doi]
@inproceedings{EidC14,
title = {On the analysis of wavelet-based approaches for print mottle artifacts},
author = {Ahmed H. Eid and Brian E. Cooper},
year = {2014},
doi = {10.1117/12.2041035},
url = {https://doi.org/10.1117/12.2041035},
researchr = {https://researchr.org/publication/EidC14},
cites = {0},
citedby = {0},
pages = {901609},
booktitle = {Image Quality and System Performance XI, San Francisco, California, USA, February 2-6, 2014},
editor = {Sophie Triantaphillidou and Mohamed-Chaker Larabi},
volume = {9016},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {9780819499332},
}