Ahmed H. Eid, Brian E. Cooper. On the analysis of wavelet-based approaches for print mottle artifacts. In Sophie Triantaphillidou, Mohamed-Chaker Larabi, editors, Image Quality and System Performance XI, San Francisco, California, USA, February 2-6, 2014. Volume 9016 of SPIE Proceedings, pages 901609, SPIE, 2014. [doi]
Abstract is missing.