Ahmed H. Eid, Brian E. Cooper, Edward E. Rippetoe. On the analysis of wavelet-based approaches for print grain artifacts. In Peter D. Burns, Sophie Triantaphillidou, editors, Image Quality and System Performance X, Burlingame, California, USA, February 3-7, 2013. Volume 8653 of SPIE Proceedings, SPIE, 2013. [doi]
@inproceedings{EidCR13,
title = {On the analysis of wavelet-based approaches for print grain artifacts},
author = {Ahmed H. Eid and Brian E. Cooper and Edward E. Rippetoe},
year = {2013},
doi = {10.1117/12.2000378},
url = {https://doi.org/10.1117/12.2000378},
researchr = {https://researchr.org/publication/EidCR13},
cites = {0},
citedby = {0},
booktitle = {Image Quality and System Performance X, Burlingame, California, USA, February 3-7, 2013},
editor = {Peter D. Burns and Sophie Triantaphillidou},
volume = {8653},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {9780819494269},
}