Ahmed H. Eid, Brian E. Cooper, Edward E. Rippetoe. On the analysis of wavelet-based approaches for print grain artifacts. In Peter D. Burns, Sophie Triantaphillidou, editors, Image Quality and System Performance X, Burlingame, California, USA, February 3-7, 2013. Volume 8653 of SPIE Proceedings, SPIE, 2013. [doi]
Abstract is missing.