Durability Assessment of Bonded Piezoelectric Wafer Active Sensors for Aircraft Health Monitoring Applications

Jesús N. Eiras, Ludovic Gavérina, Jean-Michel Roche. Durability Assessment of Bonded Piezoelectric Wafer Active Sensors for Aircraft Health Monitoring Applications. Sensors, 24(2):450, January 2024. [doi]

Abstract

Abstract is missing.