Why is the Winner the Best?

Matthias Eisenmann, Annika Reinke, Vivienn Weru, Minu Dietlinde Tizabi, Fabian Isensee, Tim J. Adler, Sharib Ali, Vincent Andrearczyk, Marc Aubreville, Ujjwal Baid, Spyridon Bakas, Niranjan Balu, Sophia Bano, Jorge Bernal, Sebastian Bodenstedt, Alessandro Casella, Veronika Cheplygina, Marie Daum, Marleen de Bruijne, Adrien Depeursinge, Reuben Dorent, Jan Egger, David G. Ellis, Sandy Engelhardt, Melanie Ganz, Noha M. Ghatwary, Gabriel Girard, Patrick Godau, Anubha Gupta, Lasse Hansen, Kanako Harada, Mattias P. Heinrich, Nicholas Heller, Alessa Hering, Arnaud Huaulmé, Pierre Jannin, A. Emre Kavur, Oldrich Kodym, Michal Kozubek 0001, Jianning Li, Hongwei Bran Li, Jun Ma 0016, Carlos Martín-Isla, Bjoern H. Menze, J. Alison Noble, Valentin Oreiller, Nicolas Padoy, Sarthak Pati, Kelly Payette, Tim Rädsch, Jonathan Rafael-Patino, Vivek Singh Bawa, Stefanie Speidel, Carole H. Sudre, Kimberlin M. H. van Wijnen, M. Wagner, D. Wei, Amine Yamlahi, Moi Hoon Yap, C. Yuan, Maximilian Zenk, A. Zia, David Zimmerer, Dogu Baran Aydogan, B. Bhattarai, Louise Bloch, Raphael Brüngel, J. Cho, C. Choi, Q. Dou, Ivan Ezhov, Christoph M. Friedrich, C. Fuller, Rebati Raman Gaire, Adrian Galdran, Álvaro García-Faura, Maria Grammatikopoulou, S. Hong, Mostafa Jahanifar, I. Jang, Abdolrahim Kadkhodamohammadi, I. Kang, Florian Kofler, S. Kondo, Hugo Jaco Kuijf, M. Li, M. Luu, Tomaz Martincic, P. Morais, M. A. Naser, B. Oliveira, D. Owen, S. Pang, J. Park, S. Park, S. Plotka, Élodie Puybareau, Nasir M. Rajpoot, K. Ryu, N. Saeed, Adam Shephard, P. Shi, Dejan Stepec, Ronast Subedi, Guillaume Tochon, Helena R. Torres, Hélène Urien, João L. Vilaça, Kareem A. Wahid, H. Wang, J. Wang, L. Wang, X. Wang, Benedikt Wiestler, Marek Wodzinski, F. Xia, J. Xie, Z. Xiong, S. Yang, Y. Yang, Z. Zhao, Klaus H. Maier-Hein, Paul F. Jäger, Annette Kopp-Schneider, Lena Maier-Hein. Why is the Winner the Best?. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023. pages 19955-19966, IEEE, 2023. [doi]

Abstract

Abstract is missing.