Bill Eklow. An update on IEEE 1149.6 - successes and issues. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 7, IEEE, 2005. [doi]
@inproceedings{Eklow05, title = {An update on IEEE 1149.6 - successes and issues}, author = {Bill Eklow}, year = {2005}, doi = {10.1109/TEST.2005.1584014}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584014}, researchr = {https://researchr.org/publication/Eklow05}, cites = {0}, citedby = {0}, pages = {7}, booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005}, publisher = {IEEE}, isbn = {0-7803-9038-5}, }