Stress-aware analog layout devices pattern generation

Khaled El-Kenawy, Mohamed Dessouky. Stress-aware analog layout devices pattern generation. In 11th International Design & Test Symposium, IDT 2016, Hammamet, Tunisia, December 18-20, 2016. pages 233-238, IEEE, 2016. [doi]

Authors

Khaled El-Kenawy

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Mohamed Dessouky

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