Khaled El-Kenawy, Mohamed Dessouky. Stress-aware analog layout devices pattern generation. In 11th International Design & Test Symposium, IDT 2016, Hammamet, Tunisia, December 18-20, 2016. pages 233-238, IEEE, 2016. [doi]
@inproceedings{El-KenawyD16,
title = {Stress-aware analog layout devices pattern generation},
author = {Khaled El-Kenawy and Mohamed Dessouky},
year = {2016},
doi = {10.1109/IDT.2016.7843046},
url = {http://dx.doi.org/10.1109/IDT.2016.7843046},
researchr = {https://researchr.org/publication/El-KenawyD16},
cites = {0},
citedby = {0},
pages = {233-238},
booktitle = {11th International Design & Test Symposium, IDT 2016, Hammamet, Tunisia, December 18-20, 2016},
publisher = {IEEE},
isbn = {978-1-5090-4900-4},
}