Khaled S. El-Kilany. Wafer lot release policies based on the continuous and periodic review of WIP levels. In 2011 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, Singapore, December 6-9, 2011. pages 1700-1704, IEEE, 2011. [doi]
@inproceedings{El-Kilany11,
title = {Wafer lot release policies based on the continuous and periodic review of WIP levels},
author = {Khaled S. El-Kilany},
year = {2011},
doi = {10.1109/IEEM.2011.6118206},
url = {http://dx.doi.org/10.1109/IEEM.2011.6118206},
researchr = {https://researchr.org/publication/El-Kilany11},
cites = {0},
citedby = {0},
pages = {1700-1704},
booktitle = {2011 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, Singapore, December 6-9, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0740-7},
}