Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait. Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(11):2556-2564, 2006. [doi]
@article{El-MalehKS06,
title = {Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation},
author = {Aiman H. El-Maleh and S. Saqib Khursheed and Sadiq M. Sait},
year = {2006},
doi = {10.1109/TCAD.2006.873895},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2006.873895},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/El-MalehKS06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {11},
pages = {2556-2564},
}