Aiman H. El-Maleh, Thomas E. Marchok, Janusz Rajski, Wojciech Maly. On Test Set Preservation of Retimed Circuits. In DAC. pages 176-182, 1995. [doi]
@inproceedings{El-MalehMRM95,
title = {On Test Set Preservation of Retimed Circuits},
author = {Aiman H. El-Maleh and Thomas E. Marchok and Janusz Rajski and Wojciech Maly},
year = {1995},
doi = {10.1145/217474.217526},
url = {http://doi.acm.org/10.1145/217474.217526},
tags = {testing},
researchr = {https://researchr.org/publication/El-MalehMRM95},
cites = {0},
citedby = {0},
pages = {176-182},
booktitle = {DAC},
}