A retiming-based test pattern generator design for built-in self test of data path architectures - researchr publication authors

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Aiman H. El-Maleh, Yahya E. Osais. A retiming-based test pattern generator design for built-in self test of data path architectures. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 550-553, IEEE, 2001. [doi]

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