Aiman H. El-Maleh, Yahya E. Osais. A retiming-based test pattern generator design for built-in self test of data path architectures. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 550-553, IEEE, 2001. [doi]
@inproceedings{El-MalehO01,
title = {A retiming-based test pattern generator design for built-in self test of data path architectures},
author = {Aiman H. El-Maleh and Yahya E. Osais},
year = {2001},
doi = {10.1109/ISCAS.2001.922296},
url = {http://doi.ieeecomputersociety.org/10.1109/ISCAS.2001.922296},
tags = {design science, architecture, testing, e-science, design},
researchr = {https://researchr.org/publication/El-MalehO01},
cites = {0},
citedby = {0},
pages = {550-553},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia},
publisher = {IEEE},
isbn = {0-7803-6685-9},
}