Michael Elad, Yacov Hel-Or, Renato Keshet. Pattern Detection Using a Maximal Rejection Classifier. In Carlo Arcelli, Luigi P. Cordella, Gabriella Sanniti di Baja, editors, Visual Form 2001, 4th International Workshop on Visual Form, IWVF-4, Capri, Italy, May 28-30, 2001, Proceedings. Volume 2059 of Lecture Notes in Computer Science, pages 514-524, Springer, 2001. [doi]
@inproceedings{EladHK01,
title = {Pattern Detection Using a Maximal Rejection Classifier},
author = {Michael Elad and Yacov Hel-Or and Renato Keshet},
year = {2001},
url = {http://link.springer.de/link/service/series/0558/bibs/2059/20590514.htm},
researchr = {https://researchr.org/publication/EladHK01},
cites = {0},
citedby = {0},
pages = {514-524},
booktitle = {Visual Form 2001, 4th International Workshop on Visual Form, IWVF-4, Capri, Italy, May 28-30, 2001, Proceedings},
editor = {Carlo Arcelli and Luigi P. Cordella and Gabriella Sanniti di Baja},
volume = {2059},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-42120-3},
}