K. Elangovan, C. S. Anoop. A Digital Readout Suitable for Resistive Sensors Affected with a Parasitic Capacitance Element. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2021, Glasgow, United Kingdom, May 17-20, 2021. pages 1-5, IEEE, 2021. [doi]
@inproceedings{ElangovanA21a,
title = {A Digital Readout Suitable for Resistive Sensors Affected with a Parasitic Capacitance Element},
author = {K. Elangovan and C. S. Anoop},
year = {2021},
doi = {10.1109/I2MTC50364.2021.9459891},
url = {https://doi.org/10.1109/I2MTC50364.2021.9459891},
researchr = {https://researchr.org/publication/ElangovanA21a},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2021, Glasgow, United Kingdom, May 17-20, 2021},
publisher = {IEEE},
isbn = {978-1-7281-9539-1},
}