K. Elangovan, C. S. Anoop. A Digital Readout Suitable for Resistive Sensors Affected with a Parasitic Capacitance Element. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2021, Glasgow, United Kingdom, May 17-20, 2021. pages 1-5, IEEE, 2021. [doi]
No references recorded for this publication.
No citations of this publication recorded.