Exploiting Engineered IQ Samples for Physical Layer Authentication

Hossien B. Eldeeb, Anshul Pandey, Martin Andreoni Lopez, Sami Muhaidat. Exploiting Engineered IQ Samples for Physical Layer Authentication. In 98th IEEE Vehicular Technology Conference, VTC Fall 2023, Hong Kong, SAR, China, October 10-13, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

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