Hassan Eldib, Chao Wang, Mostafa M. I. Taha, Patrick Schaumont. Quantitative Masking Strength: Quantifying the Power Side-Channel Resistance of Software Code. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(10):1558-1568, 2015. [doi]
@article{EldibWTS15,
title = {Quantitative Masking Strength: Quantifying the Power Side-Channel Resistance of Software Code},
author = {Hassan Eldib and Chao Wang and Mostafa M. I. Taha and Patrick Schaumont},
year = {2015},
doi = {10.1109/TCAD.2015.2424951},
url = {http://dx.doi.org/10.1109/TCAD.2015.2424951},
researchr = {https://researchr.org/publication/EldibWTS15},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {34},
number = {10},
pages = {1558-1568},
}