A low-leakage, hybrid ESD power supply clamp in 65nm CMOS technology

Mahdi Elghazali, Manoj Sachdev, Ajoy Opal. A low-leakage, hybrid ESD power supply clamp in 65nm CMOS technology. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]

@inproceedings{ElghazaliSO14,
  title = {A low-leakage, hybrid ESD power supply clamp in 65nm CMOS technology},
  author = {Mahdi Elghazali and Manoj Sachdev and Ajoy Opal},
  year = {2014},
  doi = {10.1109/CICC.2014.6945995},
  url = {http://dx.doi.org/10.1109/CICC.2014.6945995},
  researchr = {https://researchr.org/publication/ElghazaliSO14},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014},
  publisher = {IEEE},
}