Device matching measurements in 28nm technology for high energy physics experiments

Moataz Elkhayat, Stefano Mangiarotti, Claudio De Berti, Marco Grassi, Piero Malcovati, Domenico Albano, Andrea Baschirotto. Device matching measurements in 28nm technology for high energy physics experiments. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 13-16, IEEE, 2016. [doi]

Abstract

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