Willemijn S. Elkhuizen, Tim Zaman, Wim Verhofstad, Pieter P. Jonker, Joris Dik, Jo M. P. Geraedts. Topographical scanning and reproduction of near-planar surfaces of paintings. In Maria V. Ortiz Segovia, Philipp Urban, Jan P. Allebach, editors, Measuring, Modeling, and Reproducing Material Appearance 2014, San Francisco, California, USA, February 2-6, 2014. Volume 9018 of SPIE Proceedings, pages 901809, SPIE, 2014. [doi]
Abstract is missing.