Melanie Elm, Hans-Joachim Wunderlich. Scan Chain Organization for Embedded Diagnosis. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008. pages 468-473, 2008. [doi]
@inproceedings{ElmW08,
title = {Scan Chain Organization for Embedded Diagnosis},
author = {Melanie Elm and Hans-Joachim Wunderlich},
year = {2008},
doi = {10.1109/DATE.2008.4484725},
url = {http://dx.doi.org/10.1109/DATE.2008.4484725},
researchr = {https://researchr.org/publication/ElmW08},
cites = {0},
citedby = {0},
pages = {468-473},
booktitle = {Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008},
}