Melanie Elm, Hans-Joachim Wunderlich. BISD: Scan-based Built-In self-diagnosis. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1243-1248, IEEE, 2010. [doi]
@inproceedings{ElmW10,
title = {BISD: Scan-based Built-In self-diagnosis},
author = {Melanie Elm and Hans-Joachim Wunderlich},
year = {2010},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5456997},
tags = {rule-based},
researchr = {https://researchr.org/publication/ElmW10},
cites = {0},
citedby = {0},
pages = {1243-1248},
booktitle = {Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010},
publisher = {IEEE},
}