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Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding. Scan chain clustering for test power reduction. In Limor Fix, editor, Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008. pages 828-833, ACM, 2008. [doi]

This author has not been identified. Look up 'Melanie Elm' in GoogleThis author has not been identified. Look up 'Hans-Joachim Wunderlich' in GoogleThis author has not been identified. Look up 'Michael E. Imhof' in GoogleThis author has not been identified. Look up 'Christian G. Zoellin' in GoogleThis author has not been identified. Look up 'Jens Leenstra' in GoogleThis author has not been identified. Look up 'Nicolas Mäding' in Google

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