Ahmed T. Elthakeb, Hamdy Abd Elhamid, Hassan Mostafa, Yehea Ismail. Performance evaluation of finFET based SRAM under statistical VT variability. In 26th International Conference on Microelectronics, ICM 2014, Doha, Qatar, December 14-17, 2014. pages 88-91, IEEE, 2014. [doi]
Abstract is missing.