A. S. Emara, A. H. Madian, H. H. Amer, S. H. Amer. High coverage test for the second generation current conveyor. In 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, December 6-9, 2015. pages 429-432, IEEE, 2015. [doi]
@inproceedings{EmaraMAA15,
title = {High coverage test for the second generation current conveyor},
author = {A. S. Emara and A. H. Madian and H. H. Amer and S. H. Amer},
year = {2015},
doi = {10.1109/ICECS.2015.7440340},
url = {http://dx.doi.org/10.1109/ICECS.2015.7440340},
researchr = {https://researchr.org/publication/EmaraMAA15},
cites = {0},
citedby = {0},
pages = {429-432},
booktitle = {2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, December 6-9, 2015},
publisher = {IEEE},
isbn = {978-1-5090-0246-7},
}