A. S. Emara, A. H. Madian, H. H. Amer, S. H. Amer. High coverage test for the second generation current conveyor. In 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, December 6-9, 2015. pages 429-432, IEEE, 2015. [doi]
Abstract is missing.